KLA

The KLA P 16 Surface is a surface profilometer in the metrology and inspection category.[4][5]
The KLA P 16 Surface is a mechanical profilometer in the KLA P family.[6]
A surface profilometer measures surface topography by mechanically tracing a stylus across a sample and converting vertical motion into height data.
A profilometer of this class is used to quantify step height, roughness, and other surface features on semiconductor and precision-manufactured parts.
Surface profilometers are used in metrology and inspection to check film steps, etched features, and surface form during process development and production control.
The KLA P 16 Surface fits in the measurement flow after fabrication steps that create topography and before later process decisions that depend on dimensional feedback.
A surface profilometer is used for step-height measurement, surface profile measurement, and general topography inspection.
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The following facts about the P 16 Surface are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the P 16 Surface are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the P 16 Surface are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the P 16 Surface are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the P 16 Surface are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the P 16 Surface is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 6, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.