ASML
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The ASML Twinscan AT 400 S i-Line is a step-and-scan lithography system. In step-and-scan operation, the reticle is scanned across a stationary illumination slit while the wafer stage moves in the opposite direction at a speed that matches the lens reduction ratio. The system uses a mercury lamp as a light source, with spectral filters selecting the i-line wavelength for exposure. The scanner aligns the wafer to the reticle using through-the-lens alignment sensors. After exposing one scanning field, the wafer stage steps to the next field position and repeats the scan.
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The following facts about the Twinscan AT 400 S i-Line are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
Fewer than 3 independently cited specifications for the Twinscan AT 400 S i-Line are on record; the remainder await public documentation.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Twinscan AT 400 S i-Line are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Twinscan AT 400 S i-Line are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Twinscan AT 400 S i-Line are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Twinscan AT 400 S i-Line are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
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Last updated Oct 11, 2026.
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