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Comparison ledger

6200versus7600 Patterned Wafer Particle Defect

KLA 6200, KLA 7600 Patterned Wafer Particle Defect, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
6200KLA
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size25 Wafer Slot Cassette25 Wafer Slot Cassette
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA 6200KLA 7600 Patterned Wafer Particle Defect
Specifications
Wafer size25 Wafer Slot Cassette[1]25 Wafer Slot Cassette[3]
ConfigurationScan Stage[1]Cassette Transfer[4]
ProcessVac 23 InHg[1]—
Inlet Power1 line of 208 Vac, 15 amp[1]1 line of 208 Vac 15 Amp[3]
Voltage208 V[2]—
Frequency60 Hz[2]—
Cassette capacity25 wafer slots[1]—
Process vacuum23 InHg[1]—
ExhaustBlower for laser cooling[1]Exhaust with Blower for laser cooling[3]
Power requirement208 Vac, 15 amp[1]—
Process Vac—23 InHg[4]
Manufacturer—KLA[3]
Category—Metrology & Inspection[3]
Cassette transfer—Included[3]
Scan stage—Included[3]
Wafer transfer—Included[3]
Boat elevator / robot transfer—Included[3]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing
  3. [3]waferpedia.comwaferpedia.com
  4. [4]inventory listing