Wyko
Provisional entry — research in progress
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Plate 01Veeco Wyko Non-contact Profilometer NT3300 (1 of 2) - training video (Georgia Tech - Microelectronics Research Center)
Plate 02Veeco Wyko Non-contact Profilometer NT3300 (2 of 2) - training video (Georgia Tech - Microelectronics Research Center)
The Wyko NT3300 is an optical metrology tool rather than a fabrication tool. The instrument measures surface topography by sensing height changes across a sample and converting those measurements into a profile.
An optical profiler in this class is typically used by focusing or interferometric methods that compare light reflected from the sample surface against a reference condition. The resulting data are processed into height, roughness, or step-related measurements.
The Wyko NT3300 sits in the inspection and metrology portion of the cleanroom workflow. The instrument is used after fabrication steps that create thin films, patterned layers, or etched features, when surface geometry must be checked.
The Wyko NT3300 supports process control by providing non-contact measurements before a device or wafer proceeds to later fabrication or qualification steps.
The Wyko NT3300 is suitable for measuring surface profile features on microfabricated samples. The instrument class is commonly used for film thickness related step measurements, surface roughness checks, and etched-feature depth measurements.
The Wyko NT3300 is used in metrology tasks associated with semiconductor and microfabrication work. The tool class is relevant to patterned wafers, thin films, and other surfaces that require quantitative topography inspection.
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Many systems can measure transparent films if the interference signal from the top surface is distinguishable, though performance depends on film thickness, refractive index, and the instrument's coherence length.
Common applications include measuring surface roughness, step heights, flatness, and texture in semiconductor manufacturing, optics fabrication, MEMS development, and materials science research.
Limitations include sensitivity to vibration, requirement for sufficient sample reflectivity, and potential difficulty measuring steep slopes or rough surfaces beyond the dynamic range.
The following facts about the NT3300 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the NT3300 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the NT3300 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the NT3300 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the NT3300 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the NT3300 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 3, 2026.