Thermo Fisher
Scientific FEI FIB 800
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
The Thermo Fisher Scientific FEI FIB 800 is a metrology and inspection tool.[2]
How it works
General reference — not yet source-verifiedA focused ion beam system uses a tightly controlled ion beam to interact with a small region of a sample surface.
A metrology and inspection instrument in this class is used to observe, analyze, and locally modify material at fine spatial scales.
Where it fits in the process flow
The Thermo Fisher Scientific FEI FIB 800 belongs in the metrology and inspection segment of the semiconductor workflow.[2]
Applications
General reference — not yet source-verifiedA focused ion beam instrument is used for site-specific cross sectioning, failure analysis, circuit editing, sample preparation, and localized material removal.
A metrology and inspection tool of this class is used for detailed examination of device features and process-related defects.
What do the numbers mean?
Configuration & options5
- Field Emission Gun[2]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Not publicly documented
The following facts about the Scientific FEI FIB 800 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Scientific FEI FIB 800 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Scientific FEI FIB 800 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Scientific FEI FIB 800 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Scientific FEI FIB 800 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Scientific FEI FIB 800 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]waferpedia.com — waferpedia.comwaferpedia.com
Last updated Oct 10, 2026.
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