Rigaku
Ultima III
The Rigaku Ultima III is a powder diffractometer. The Rigaku Ultima III operates in theta/2theta mode. The Rigaku Ultima III can analyze bulk powders, thin films, and liquids.[1]
What it is
How it works
The Rigaku Ultima III operates in theta slash two-theta mode.[1]
Where it fits in the process flow
The Rigaku Ultima III is used after sample preparation or process steps that produce powders, thin films, or other material forms that can be analyzed by X-ray diffraction.[1]
Applications
What do the numbers mean?
Power & electrical5
Optics & imaging7
- 1D D/teX Ultra high-speed silicon strip detector[2]
- Detectors
- Scintillation point detector and a high-speed position sensitive detector system Dtex Ultra[2]
- Optics
- Bragg Brentano parafocusing optics and parallel beam optics with a parabolic X-ray mirror[2]
- Detector
- Scintillation point detector and high-speed position sensitive detector system Dtex Ultra[2]
- Detectors
- Scintillation point detector and high-speed position sensitive detector system Dtex Ultra[2]
Performance2
- Stage / goniometer
- Five axes high precision goniometer, fixed standard stage, and thin-film stage[2]
Control & software3
Configuration & options15
- Automatic sample exchanger (ASC-10)[2]
- Monochromator
- Ge (220) 2-bounce incident beam monochromator and graphite diffraction beam monochromator[2]
- Sample stages
- Standard powder stage, thin-film stage, small angle X-ray scattering stage (SAXS), and Differential Scanning Calorimetry-X-ray Diffraction Stage (DSC-XRD) stage[1]
- Stage(s)
- Standard powder stage, thin-film stage, small angle X-ray scattering stage (SAXS), and Differential Scanning Calorimetry-X-ray Diffraction stage (DSC-XRD)[1]
- Monochromators
- Ge (220) 2-bounce incident beam monochromator and graphite diffraction beam monochromator[2]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Which sample types are compatible with this class of instrument?General reference — not yet source-verified
X-ray diffractometers can analyze powders, bulk solids, thin films, and epitaxial layers. Samples must be crystalline or partially crystalline; amorphous materials produce broad, featureless patterns. Typical sizes range from a few millimeters to several centimeters, depending on the sample stage design.
How long does a typical measurement take?General reference — not yet source-verified
Measurement time varies widely based on the required angular range, step size, count time per step, and the X-ray intensity. A basic phase identification scan may take minutes, while high-resolution reciprocal space mapping for epitaxial films can take hours. Many instruments allow automated batch runs.
What are the common maintenance requirements for such an instrument?General reference — not yet source-verified
Routine maintenance includes regular alignment checks, cleaning of optics and detectors, monitoring X-ray tube performance and replacing it after a certain number of operating hours, ensuring water cooling systems are functioning, and calibrating the goniometer. Preventive maintenance schedules are provided by the manufacturer.
Not publicly documented
The following facts about the Ultima III are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Ultima III are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Ultima III are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Ultima III are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Ultima III are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Ultima III is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (6)Every fact above is drawn from these public sources
- [1]cint.lanl.gov — cint.lanl.govcint.lanl.gov
- [2]Inventory photo
- [3]nist.gov — nist.govnist.gov
- [4]ncnr.nist.gov — ncnr.nist.govncnr.nist.gov
- [5]weizmann.ac.il — weizmann.ac.ilweizmann.ac.il
- [6]Rigaku Ultima III PXRD | Departmental Facilities | Department of Chemistry and Biochemistry | TTU — depts.ttu.edudepts.ttu.edu
Last updated Oct 11, 2026.
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