Rasco
SO 1000
The Rasco SO 1000 is a tri-temperature handler for semiconductor packages such as SSOP, SOIC, and TSSOP. The Rasco SO 1000 uses LN2 for cold temperature testing. The Rasco SO 1000 operates on a 230 V, 2300 W power supply and requires 5 to 10 bars of compressed air.[1]
What it is
General reference — not yet source-verifiedSemiconductor test handlers are automated machines that transport packaged integrated circuits to a test station, where they are electrically tested and then sorted into bins based on test results.
How it works
General reference — not yet source-verifiedA handler picks individual devices from input trays or tubes and places them onto a test track. The handler indexes each device through a temperature conditioning zone to bring it to the required test temperature. At the test station, the handler presses the device contacts against a test head that connects to an automated test equipment system. After testing, the handler sorts the device into an appropriate output bin based on the test result.
Where it fits in the process flow
General reference — not yet source-verifiedThe handler is used in the final test stage of semiconductor manufacturing, after packaging and before device marking and shipment. The handler receives packaged units from the assembly line and delivers them to the test floor, where they are electrically characterized. After test, the handler outputs devices to tubes, trays, or tape-and-reel for downstream processes or shipping.
Why won't it start?
Documented failure modes, common issues, and field considerations.
- Missing parts - not operational
What do the numbers mean?
Power & electrical1
Wafer handling1
Configuration & options8
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Multitest MT 9510 XP— Same function class: Test & Probe, nullCompare in depthsource[1]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- Power Supply230 v / 2300 W[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What power supply is required for the Rasco SO 1000?
The handler requires a power supply of 230 volts and 2300 watts.[1]
What air supply is required for the Rasco SO 1000?
The handler requires an air supply of 5 to 10 bars.[1]
What package types does the Rasco SO 1000 support?
The handler supports SSOP, SOIC, and TSSOP package types with change kits.[1]
Not publicly documented
The following facts about the SO 1000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the SO 1000 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the SO 1000 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the SO 1000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the SO 1000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the SO 1000 are on record.
Answerable by: an OEM parts catalog or a service engineer
Sources & citations
Sources (4)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Inventory photo
Last updated Oct 11, 2026.
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The Multitest MT 9510 XP is a pick-and-place handler designed for tri-temp testing of semiconductor devices, with temperature accuracy demonstrated for BGA packages.
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