LTX-Credence
ASLx
What it is
Where it fits in the process flow
General reference — not yet source-verifiedA test-and-probe system fits into semiconductor test flow at the wafer or probe stage before final package-level screening.
Applications
General reference — not yet source-verifiedAnalog test systems are used for electrical characterization and verification of semiconductor devices.
What do the numbers mean?
Control & software1
Configuration & options12
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Not publicly documented
The following facts about the ASLx are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the ASLx are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the ASLx are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the ASLx are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the ASLx are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the ASLx is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]LTX-Credence — apmail.ltxc.com (Sep 14, 2011)web.archive.org
Last updated Oct 9, 2026.
