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KLA

Surfscan 6420

KLA Surfscan 6420 family
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Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

The KLA-Tencor Surfscan 6420 is an unpatterned surface inspection system that detects, counts, and sizes particle defects on wafers. The Surfscan 6420 uses a 30 mW Argon-Ion laser at 488 nm and achieves a defect sensitivity better than 0.12 µm on polished silicon at a 95% capture rate.[1][2]

KLASurfscan 6420
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Power

208V, 60 Hz, 1 phase, 16A[4]

Performance

Within 1%[5]

Optics

30 mW Argon-Ion laser, 488 nm[2]

How it works

The KLA Surfscan 6420 uses a laser-based scanning system with a 30 mW argon-ion laser operating at a wavelength of 488 nm. The system employs low-angle optics and performs multi-angle darkfield inspection to capture scattered light from surface particles.[2][3][5]

The operating software for the system is Windows 98. The system handles wafers via a single puck mechanism that transfers wafers from a single cassette or platform.[2][3]

Where it fits in the process flow

In fab environments, the system has been used for quality control of PECVD and LPCVD nitride furnaces. The tool is also widely applied in memory device manufacturing, logic device manufacturing, and advanced packaging applications.[1][5]

Applications

The KLA Surfscan 6420 measures particles on polished silicon surfaces, epitaxial layers, and thin films including oxide, nitride, and polymer or resist layers. The system can detect particle sizes from 0.15 µm to greater than 3 µm.[1]

What do the numbers mean?

Power & electrical1

Power requirements
208V, 60 Hz, 1 phase, 16A[4]
Accurate?

Wafer handling6

Throughput
Up to 100 wafers per hour (200 mm)[1]
Accurate?
Substrate sizes
2", 3", 4", 6", 8" wafers[2]
Accurate?
Substrate thickness
Adjustable up to 12 mm[2]
Accurate?
Cassette handling
Single puck handling from single cassette or platform[2]
Accurate?
Batch size
1-25 wafers[1]
Accurate?
Substrate materials
Silicon, thin layers of oxide, nitride, polymer/resist[1]
Accurate?

Optics & imaging1

Illumination source
30 mW Argon-Ion laser, 488 nm[2]
Accurate?

Performance2

Repeatability
Within 1%, 1σ (mean count >500, 0.204 µm PSL)[1]
Accurate?
Accuracy
Within 1%[5]
Accurate?

Control & software1

Operating software
Windows 98[2]
Accurate?

Configuration & options6

Defect sensitivity (polished silicon)
Better than 0.12 µm at 95% capture rate[2]
Accurate?
Defect sensitivity (most surfaces)
Better than 0.12 µm[3]
Accurate?
Particle size range
0.15 µm to greater than 3 µm[1]
Accurate?
Material compatibility
Any surface that scatters less than 90% of incident light[2]
Accurate?
Process temperature
Room temperature[1]
Accurate?
Haze sensitivity
0.02 ppm[5]
Accurate?

Vintage & configurations

  1. 2023-04End of life[1]

    Decommissioned at DTU Nanolab

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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Power requirements208V, 60 Hz, 1 phase, 16A[4]

Parts & consumables

Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.

  • KLA Surfscan 6420 SBC BoardIn Productionsource[6]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What illumination source does the Surfscan 6420 use?

The system uses a 30 mW argon-ion laser operating at a wavelength of 488 nm.[2][3]

What operating system does the Surfscan 6420 run?

The system runs Windows 98 operating software.[2][3]

What is the particle size detection range?

The system can measure particles from 0.15 µm to greater than 3 µm on polished silicon.[1]

Not publicly documented

The following facts about the Surfscan 6420 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented variants, configuration options, or revision breakpoints of the Surfscan 6420 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Surfscan 6420 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Surfscan 6420 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Surfscan 6420 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly hosted manuals, SOPs, or datasheets for the Surfscan 6420 are on record.

    Answerable by: university cleanroom staff or an OEM application specialist

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Sources & citations

Sources (7)Every fact above is drawn from these public sources
  1. [1]labadviser.nanolab.dtu.dk — labadviser.nanolab.dtu.dklabadviser.nanolab.dtu.dk
  2. [2]classoneequipment.com — classoneequipment.comclassoneequipment.com
  3. [3]classoneequipment.com — classoneequipment.comclassoneequipment.com
  4. [4]waferpedia.comwaferpedia.com
  5. [5]wotol.com — wotol.comwotol.com
  6. [6]Equipment inventory listing
  7. [7]Equipment inventory listing
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Last updated Sep 28, 2026.

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