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KLA

5200

Metrology & InspectionKLA 5200 family
Research Quality: 60% complete

The KLA 5200 is an overlay metrology system. The KLA 5200 uses Coherence Probe Microscopy (CPM), a patented white-light interferometric technique. The KLA 5200 can measure feature sizes down to .18 µm.[1]

5200 — web.archive.org
Fig. 015200web.archive.org[1]

What it is

The KLA 5200 is an overlay metrology system for advanced lithography.[1]

How it works

The KLA 5200 uses Coherence Probe Microscopy, a white-light interferometric technique that identifies surfaces rather than only edges.[1]

The KLA 5200 includes built-in analysis software and a graphical user interface for production operation, in-line process qualification, and off-line engineering analysis.[1]

Where it fits in the process flow

The KLA 5200 supports chipmakers in tightening process specifications, improving process control, and reducing lithography-related delay in product introduction.[1]

Applications

The KLA 5200 is used for overlay metrology for advanced lithography.[1]

The KLA 5200 is intended for measuring all layers, including low-contrast or grainy targets.[1]

  • Overlay metrology for advanced lithography
  • In-line process qualification
  • Off-line engineering analysis

What do the numbers mean?

Performance1

insp
Overlay Registration System/6in.[2]
Accurate?

Control & software2

Software
Built-in analysis software[1]
Accurate?
User interface
Graphical user interface[1]
Accurate?

Configuration & options5

Measurement technology
Coherence Probe Microscopy (CPM), a patented white-light interferometric technique[1]
Accurate?
Targets measured
Surfaces, including low-contrast or grainy targets[1]
Accurate?
Feature size capability stated
Down to 0.18 µm[1]
Accurate?
Feature size capability
down to 0.18 µm[1]
Accurate?
Targets measured
All layers, including low-contrast or grainy targets[1]
Accurate?
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Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

What type of equipment is the KLA 5200?

The KLA 5200 is a comprehensive overlay metrology system.[1]

What measurement method does the KLA 5200 use?

The KLA 5200 uses Coherence Probe Microscopy, a patented white-light interferometric technique.[1]

What does the KLA 5200 measure?

The KLA 5200 measures surfaces and can measure all layers, including low-contrast or grainy targets.[1]

What software features are part of the KLA 5200?

The KLA 5200 includes built-in analysis software and a graphical user interface.[1]

Not publicly documented

The following facts about the 5200 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 5200 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the 5200 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the 5200 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the 5200 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the 5200 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (2)Every fact above is drawn from these public sources
  1. [1]web.archive.org — web.archive.orgweb.archive.org
  2. [2]dealer listingwotol.com
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Last updated Oct 10, 2026.

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