Hitachi
The Hitachi TM 3030 Plus is a desktop scanning electron microscope. The Hitachi TM 3030 Plus is equipped with a premium SE detector. The Hitachi TM 3030 Plus is capable of quick SE image observation without specimen preparation.[1][2]

The Hitachi TM 3030 Plus is a desktop scanning electron microscope used for metrology and inspection.[5][2]
The TM 3030 Plus is a tabletop electron microscope that supports secondary electron imaging and backscattered electron imaging.[2][3]
The TM 3030 Plus is used for observing samples quickly, including samples that can be placed directly on the stage for surface and compositional analysis.[3]
TM3030Plus released in August 2014.
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The following facts about the TM 3030 Plus are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented variants, configuration options, or revision breakpoints of the TM 3030 Plus are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the TM 3030 Plus are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the TM 3030 Plus are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the TM 3030 Plus is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the TM 3030 Plus are on record.
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Last updated Oct 11, 2026.
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