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Hitachi

S 4160 FE-SEM

Metrology & InspectionProduced 1996–Hitachi S 4160 FE-SEM family
Research Quality: 20% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

The Hitachi S 4160 is a field emission scanning electron microscope (FE-SEM) introduced in 1996.[1]

Hitachi logo
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What it is

The Hitachi S 4160 is a field emission scanning electron microscope manufactured by Hitachi.[1]

How it works

General reference — not yet source-verified

The electron probe is scanned across the sample in a raster pattern by deflection coils. The interaction of the electron beam with the sample produces various signals, such as secondary electrons, which are collected by a detector to form an image. The depth of field and resolution are superior to light microscopes.

What do the numbers mean?

Configuration & options1

Vintage
1996[1]
Accurate?

Vintage & configurations

  1. 1996Production start[1]

    Introduced in 1996

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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What type of instrument is the Hitachi S 4160?

The Hitachi S 4160 is a field emission scanning electron microscope.[1]

Who manufactured the Hitachi S 4160?

The Hitachi S 4160 was manufactured by Hitachi.[1]

Not publicly documented

The following facts about the S 4160 FE-SEM are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • Fewer than 3 independently cited specifications for the S 4160 FE-SEM are on record; the remainder await public documentation.

    Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it

  • No publicly documented variants, configuration options, or revision breakpoints of the S 4160 FE-SEM are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the S 4160 FE-SEM are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the S 4160 FE-SEM are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the S 4160 FE-SEM is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (1)Every fact above is drawn from these public sources
  1. [1]Equipment inventory listing
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Last updated Sep 30, 2026.

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