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Hitachi

8820

Hitachi 8820 family
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Provisional entry — research in progress

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What it is

The Hitachi 8820 is a CD-SEM manufactured by Hitachi. The system accepts wafers of 200 mm (8-inch) or 150 mm (6-inch) diameter, with a special carrier available for 50 mm (2-inch) to 125 mm (5-inch) wafers. The CD measurement range is 0.1 to 10 μm, with a measurement reproducibility of ±1 % or 0.005 μm (3 sigma), whichever is larger. Throughput is specified as 20 wafers per hour in continuous measurement with 1 point per chip and 5 chips per wafer. The secondary electron image resolution is 5 nm at an accelerating voltage of 0.8 kV, using a dedicated reference specimen. Magnification covers the range ×1000 to ×150,000 for the SEM image, and approximately ×110 for the optical microscope image.[1]

How it works

The Hitachi 8820 uses a Schottky emission electron gun with an accelerating voltage variable from 700 V to 1300 V in 10 V steps. The lens system consists of an electromagnetic condenser lens system and an FCM (final condenser and objective) objective lens. Secondary electrons are detected by a 1-stage detection system. The objective lens aperture is a heating-type movable aperture with four openings selectable from outside the column, allowing fine adjustment. A two-stage deflection scanning coil and an 8-pole electromagnetic stigmator coil (X, Y) are employed. Probe current can be monitored via an incorporated Faraday cup with automatic measurement. The system also includes an optical microscope providing a 1.2 mm square visual field with monochrome image.[1]

Wafer handling in the Hitachi 8820 is performed by a cassette-to-cassette auto loader. Wafers are transferred from an open cassette to the loader chamber by an arm-type robot with random access capability using two cassettes. Vacuum chucking is used on the back of the wafer, and orientation flat detection is done by a non-contact optical sensor. After loading, the loader chamber is automatically evacuated and the wafer is transferred to the stage. The stage has a movement range of X and Y from 0 to 200 mm, driven by pulse motors with computer control up to a maximum speed of 50 mm/s.[1]

What do the numbers mean?

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Frequently asked questions

What wafer sizes does the Hitachi 8820 support?

The Hitachi 8820 supports 8-inch (200 mm) and 6-inch (150 mm) wafers, with a special carrier available for 2-inch to 5-inch wafers.[1]

What is the CD measurement range of the Hitachi 8820?

The CD measurement range is 0.1 to 10 μm.[1]

What is the accelerating voltage range of the Hitachi 8820?

The accelerating voltage is variable from 700 V to 1300 V in 10 V steps.[1]

What type of electron gun does the Hitachi 8820 use?

The electron gun is a Schottky emission type (high brightness and long service life).[1]

What is the image resolution of the Hitachi 8820?

The secondary electron image resolution is 5 nm (50 Å) at an accelerating voltage of 0.8 kV with a reference specimen dedicated for resolution measurement.[1]

What is the throughput of the Hitachi 8820?

Throughput is 20 wafers per hour in continuous measurement conditions (1 point per chip, 5 chips per wafer).[1]

Not publicly documented

The following facts about the 8820 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No specifications for the 8820 are on record.

    Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 8820 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the 8820 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the 8820 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the 8820 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

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Sources & citations

Sources (2)Every fact above is drawn from these public sources
  1. [1]Hitachi CD-SEM S-8820 Critical Dimension Scanning Electron Microscope | SemiStar — semistarcorp.comsemistarcorp.com
  2. [2]Equipment inventory listing
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Last updated Sep 28, 2026.

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