Filmetrics
Provisional entry — research in progress
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Film thickness mapping tools of this class use spectral reflectance to measure the thickness of thin films on a substrate.
The Filmetrics F80-A is used in semiconductor manufacturing for in-line product-wafer metrology, specifically to measure film thickness on patterned wafers.[1]
The F80-A is applied to patterned wafers for product-wafer metrology in semiconductor fabs.[1]
Introduced 2010
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The following facts about the F80-A are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented variants, configuration options, or revision breakpoints of the F80-A are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the F80-A are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the F80-A are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the F80-A is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the F80-A are on record.
Answerable by: an OEM parts catalog or a service engineer
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Last updated Oct 11, 2026.