Cascade Microtech
Elite 300 Wafer
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Cascade Microtech Elite 300 Wafer Prober is an automated semiconductor wafer probe station. The Elite 300 handles 12-inch wafers. The Elite 300 is equipped with a precision, low-noise automated Femtoguard temperature chuck.[1][2]
What it is
General reference — not yet source-verifiedWafer probers are used to bring test probes into controlled contact with device structures on a wafer so that electrical measurements can be taken before singulation. A wafer prober is part of the test and probe stage of semiconductor manufacturing and laboratory characterization.
How it works
General reference — not yet source-verifiedA wafer prober positions a wafer on a chuck and moves the probe card or probe needles into alignment with targeted pads or structures. The prober then establishes repeatable contact for electrical testing, characterization, or debugging.
Where it fits in the process flow
General reference — not yet source-verifiedThe Elite 300 Wafer fits in the semiconductor probe and test flow before wafer dicing and final packaging. The tool supports wafer-level inspection and electrical verification on intact wafers.
Applications
What do the numbers mean?
Wafer handling4
- Femtoguard temperature chuck[1]
Performance1
- Precision Low Noise[1]
Configuration & options1
- Automated[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the Elite 300 Wafer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Elite 300 Wafer are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Elite 300 Wafer are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Elite 300 Wafer are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Elite 300 Wafer are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Elite 300 Wafer is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]inventory listing
- [2]CASCADE MICROTECH ELITE 300 WAFER PROBE STATION — bidspotter.combidspotter.com
Last updated Oct 10, 2026.
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