Camtek
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The Camtek Eagle i is a semiconductor inspection and metrology tool for 2D surface inspection and metrology. The system supports inspection of surface defects and measurement tasks in production environments.[2]
The Eagle i uses optical inspection and metrology functions to examine wafer surfaces. The system combines high resolution optics, image processing, algorithms, and flexible software with multiple handling options.[2]
The Eagle i can use CAD based inspection. The system can run successive scans in one cycle with different focus, magnification, illumination, sensitivity, and detection engine settings.[3]
The Eagle i sits in semiconductor fabrication after process steps that create wafer features and before downstream yield analysis or further rework decisions. The tool is used for operational quality control, probe mark inspection, post dicing inspection, and pre and post bumped wafer inspection.[2]
The Eagle i also supports inspection of reconstructed wafers and inspection and metrology tasks for CMOS image sensor production. The system is intended for high volume production inspection and metrology.[2]
The Eagle i is used for 2D surface inspection and metrology. The system is applied to operational quality control, probe mark inspection, post dicing, reconstructed wafers, and pre and post bumped wafers.[2]
The Eagle i supports inspection and metrology for CMOS image sensor manufacturing. The system can also be used for encapsulation related applications, RDL inspection, panel transmission and detection, and warped wafer transfer and detection.[2][3]
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The following facts about the Eagle i are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No specifications for the Eagle i are on record.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Eagle i are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Eagle i are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Eagle i are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Eagle i are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
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Last updated Oct 2, 2026.
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KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.