Advantest
T 6371
Advantest T 6371 is a tester. Advantest T 6371 is an LCD driver test system. Advantest T 6371 supports up to 125/250MHz operation.[1][2]
What it is
The Advantest T 6371 is an LCD driver test system.[2]
How it works
The Advantest T 6371 can test at up to 125/250 megahertz (T6371).[1]
Where it fits in the process flow
General reference — not yet source-verifiedIn the semiconductor manufacturing flow, test systems like the T 6371 verify performance against specifications, ensuring that only devices meeting required parameters proceed to assembly or customers.
What do the numbers mean?
Power & electrical12
Control & software1
Configuration & options16
Vintage & configurations
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- Phase3 Phase / 4 Wire[2]
- Configuration50/60 Hz[2]
- Configuration125/250MHz[2]
- PPS 20V8Ch[2]
- PPS40V8Ch[2]
- Power3 Phase / 4 Wire - 200/208 Vac - 50/60 Hz[2]
- SystemTC_UNIT: TC7 - 125/250MHz[2]
- Per Pin Power Supply (PPS) 20V8Ch[2]
- Per Pin Power Supply (PPS) 40V8Ch[2]
- Maximum test frequency125/250MHz[1]
- Maximum frequency125/250MHz[1]
- I/O channelsTH1 I/O: 256Ch; LCD: 768Ch; PPS 20V: 8Ch; PPS40V: 8Ch; RVS: 32Ch[2]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What types of devices can a test and probe system like the T 6371 test?General reference — not yet source-verified
Systems of this class can test a broad variety of semiconductor devices, including digital, analog, mixed-signal, memory, and RF devices, depending on the specific test electronics and probe hardware installed.
What is the typical throughput of such a test system?General reference — not yet source-verified
Throughput depends on device complexity, test program efficiency, and parallelism. Systems are designed to handle multiple devices in parallel to achieve high production rates, but exact numbers vary with each setup.
Does the T 6371 support wafer-level testing only, or also packaged-device testing?General reference — not yet source-verified
Test and probe systems can be configured for wafer probing, package testing, or both, depending on the handling peripherals and probe interface used.
How are probe cards changed for different device types?General reference — not yet source-verified
Probe cards are typically interchangeable, allowing the system to be rapidly reconfigured for different device layouts. The changeover involves removing the old card, installing a new one, and aligning it with the test head.
What kind of test software is used to program the T 6371?General reference — not yet source-verified
Advantest provides its own test operating system and programming environment, often used with standard languages like C++ or proprietary scripting, to define test programs and sequences for various devices.
Not publicly documented
The following facts about the T 6371 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the T 6371 are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the T 6371 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the T 6371 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the T 6371 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the T 6371 are on record.
Answerable by: an OEM parts catalog or a service engineer
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (4)Every fact above is drawn from these public sources
- [1]web.archive.org — advantest.co.jp (Dec 6, 2004)web.archive.org
- [2]Inventory photo
- [3]inventory listing
- [4]Equipment inventory listing
Last updated Sep 30, 2026.
