Advantest
T 5585
What it is
How it works
The available information lists internal boards and related assemblies for the Advantest T 5585, including PPS Boards (Pattern Pin Supply), a CAL/SIG Board, a STRB GEN Board, a TGFC IF Board, SC DIST Board, SC IF Board, an SCU Backplane, a Test Head VIO I/F, and Dummy PE Boards.[2]
What do the numbers mean?
Power & electrical3
Wafer handling1
Performance1
Control & software1
- HDD and Software included[2]
Configuration & options14
- Core Boards:[2]
- PPS Boards (Pattern Pin Supply) – BGR‑022365 (Qty 8 – dual head configuration)[2]
- CAL/SIG Board – BGR 024351[2]
- STRB GEN Board – BGR 024444[2]
- TGFC IF Board – BGR 024356[2]
- SC DIST Board – BGR 024362[2]
- SC IF Board – BGR 024361[2]
- SCU Backplane – BLZ 024360[2]
- Test Head VIO I/F – BGR 024353[2]
- Dummy PE Boards – BGR 025800[2]
Vintage & configurations
Documented models & variants
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| T5586 | — | — | Adds a Tracing Check function for precisely measuring output timing of devices with jitter | web.archive.org[3] |
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
How does the tester connect to the device under test?General reference — not yet source-verified
At wafer level the tester connects through a probe card on a prober; for packaged parts it uses a test socket on a handler. The test head provides the contact interface in both cases.
What kinds of measurements can be performed?General reference — not yet source-verified
The system performs functional read and write tests as well as parametric measurements of supply current, output levels, leakage, timing margins, and other electrical characteristics.
Can equipment of this class be used outside production?General reference — not yet source-verified
Yes. Machines of this class are also used in engineering characterization and failure analysis to understand device behavior and support yield improvement.
Not publicly documented
The following facts about the T 5585 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the T 5585 are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the T 5585 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the T 5585 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the T 5585 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the T 5585 are on record.
Answerable by: an OEM parts catalog or a service engineer
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (4)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]web.archive.org — advantest.co.jp (Dec 6, 2004)web.archive.org
- [4]Equipment inventory listing
Last updated Sep 29, 2026.
