Waferpedia

Accretech

APM 90 A

Test & ProbeAccretech APM 90 family
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The Accretech APM 90 A is a semiconductor prober for test and probe work. The Accretech APM 90 A uses a TSK hot chuck, a manually clamped 200 mm PC adapter, and an AVME 127 CPU. The Accretech APM 90 A supports 6-inch and 8-inch wafers.[1][2]

APM 90 A — Inventory photo
Fig. 01APM 90 AInventory photo[2]

What it is

The Accretech APM 90 A is a semiconductor prober for test and probe work.[2][1]

The APM 90 A is part of the Accretech APM 90 family.[1]

How it works

The APM 90 A uses a TSK hot chuck, a manually clamped 200 mm PC adapter, and an AVME 127 CPU.[2][1]

The APM 90 A has no manipulator.[2][1]

Where it fits in the process flow

The APM 90 A is used for chip probing and process control monitoring.[8]

Applications

The APM 90 A is used in chip probing, process control monitoring, and engineering analysis.[8]

The APM 90 A supports electrical testing of wafers on a hot chuck with a manually clamped adapter.[2][1]

What do the numbers mean?

Wafer handling4

Chuck System
TSK Hot Chuck 30-155 C[1]
Accurate?
Chuck Planarity
<15 um[2]
Accurate?
Wafer size compatibility
6-inch and 8-inch wafers[8]2 sources
Accurate?
Chuck planarity
<15 um[1]
Accurate?

Control & software1

PC Adapter
Diameter 200 mm, Clamped Manually[1]
Accurate?

Configuration & options7

CPU
AVME 127[1]
Accurate?
Manipulator
N/A[1]
Accurate?
Manufacturer
Accretech[1]
Accurate?
Model
APM 90 A[1]
Accurate?
Category
Test & Probe[1]
Accurate?
Tool type
Prober[1]
Accurate?
Vintage
1996[1]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What kind of devices can this class of machine test?General reference — not yet source-verified

Machines of this class can test a wide range of semiconductor devices, including logic, memory, analog, and mixed-signal integrated circuits, as well as discrete components like diodes and transistors.

How does temperature control work in such systems?General reference — not yet source-verified

Many probing systems in this class incorporate a thermal chuck that can heat or cool the wafer over a controlled temperature range, enabling device characterization under specified thermal conditions.

What is the typical throughput of such a system?General reference — not yet source-verified

Throughput depends on factors like stepping speed, test time per device, and probe card configuration; class-level specifications are determined by the tester and handler integration.

Can this machine handle different wafer sizes?General reference — not yet source-verified

Probing systems of this class are typically designed to accommodate a range of wafer diameters, with stage travel and chuck size matched to the specific platform, though exact sizes are model-dependent.

Not publicly documented

The following facts about the APM 90 A are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the APM 90 A are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the APM 90 A are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the APM 90 A are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the APM 90 A are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the APM 90 A is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (8)Every fact above is drawn from these public sources
  1. [1]waferpedia.com — waferpedia.comwaferpedia.com
  2. [2]Inventory photo
  3. [3]Inventory photo
  4. [4]Inventory photo
  5. [5]Inventory photo
  6. [6]Inventory photo
  7. [7]Inventory photo
  8. [8]junr.com.cn — junr.com.cnjunr.com.cn
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Last updated Oct 7, 2026.

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