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Manufacturer

LEO

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3 entries

  1. 1450 VPLEO

    The LEO 1450 VPSE is a variable-pressure scanning electron microscope (SEM) platform with mounted EDS microanalysis, a BSE detector system, active isolation, and dedicated control terminals.

    CategoryMetrology & Inspection
  2. 1450 VPSELEO

    The LEO 1450 VPSE is a variable-pressure scanning electron microscope with mounted EDAX EDS microanalysis, BSE detector system, active isolation, and dedicated control and analytical terminals.

    CategoryMetrology & Inspection
  3. 1550LEO

    The Zeiss LEO 1550 is a scanning electron microscope listed in the FIB / SEM / EDX / ProSEM section. The Zeiss LEO 1550 is associated with SEM imaging and sample holders for 4 inch wafers, 6 inch wafers, and 6 inch masks.

    CategoryMetrology & InspectionWafer4"