Comparison ledger
Multitest MT 2168, Multitest MT 2168 XT, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | MT 2168Multitest | MT 2168 XTMultitest |
|---|---|---|
| OEM | Multitest | Multitest |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Multitest MT 2168 | Multitest MT 2168 |
| Cited variants | — |
|
| Specifications | ||
| OS Version | QNX[2] | QNX[4] |
| Configuration | Some parts taken out[2] | Some parts taken out[5] |
| Operating System | QNX[2] | QNX[4] |
| STC Compliance | First handler with STC compliance[3] | — |
| Loadboard Independence | Yes[3] | — |
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