Comparison ledger
KLA .204 PSL Wafer, Nikon NWL 860 T Automatic Wafer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | Nikon |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .204 PSL Wafer | Nikon NWL 860 |
| Specifications | ||
| Configuration | NIST Traceable[1] | With Nikon Optiphot 200 Microscope[3] |
| Wafer Size | 8 inch[1] | — |
| Traceability | NIST[2] | — |
| Compatible Tools | Surfscan 6xy0, Sp1[1] | — |
| NIST Traceable | Yes[1] | — |
| Asset # | — | 71967[3] |
| Make | — | Nikon[3] |
| Model | — | NWL 860 T[3] |
| Vintage | — | 1998[3] |
| Includes | — | Nikon Optiphot 200 Microscope[3] |
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