Comparison ledger
KLA 1007, Teradyne Magnum 7, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | Magnum 7Teradyne |
|---|---|---|
| OEM | KLA | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Teradyne Magnum 7 |
| Cited variants | — | |
| Specifications | ||
| Manufacturer | KLA[2] | — |
| Model | 1007[2] | Magnum 7[4] |
| Description | Wafer Prober[2] | — |
| Wafer size | 150 mm[2] | — |
| Convertible to 8 inch wafer size | Yes[2] | — |
| Vintage | 01.06.1995[2] | — |
| Make | KLA[3] | — |
| Equipment type | Prober[3] | — |
| OEM | — | Teradyne[4] |
| Category | — | Memory Test[4] |
| Product line | — | Memory Test[5] |
| Device type | — | memory test system[5] |
| Designed for | — | testing memory devices[5] |
| Application focus | — | NAND flash testing[1] |
| Maximum I/O channels | — | 18,432[1] |
| Channel rate | — | 5.28Gbps per channel[1] |
| Supported interfaces | — | ONFI and separate command/address (SCA)[1] |
| Maximum devices tested at one time | — | 1,024[1] |
| EV configuration site count | — | up to 4 tester sites[1] |
| SSV+ configuration site count | — | up to 96 tester sites[1] |
| GV configuration site count | — | up to 128 tester sites[1] |
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