Comparison ledger
KLA 1007, Multitest MT8589, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | MT8589Multitest |
|---|---|---|
| OEM | KLA | Multitest |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | 2000– |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Multitest MT8589 |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Type | — | Gravity Handler[3] |
| Contact site | — | dual contact site[3] |
| Temperature range | — | tri-temp from -55 to 155 °C[3] |
| Conversion time | — | kitable; simple conversion in 10 to 15 min.[3] |
| Maximum throughput | — | 4,800 uph[3] |
| Package types | — | 250 different package types (DIP, SO, TO, PLCC)[3] |
| Contacting | — | standard to high power Kelvin[3] |
| Installed base | — | more than 2,000 systems[3] |
| Device size | — | 5 mm to 60 mm device length; width up to 40 mm; pitch down to 0.65 mm[3] |
| Interface | — | SECS-GEM Interface[3] |
| Device spectrum | — | high power contact spring[3] |
| Contact sites | — | Dual contact site[3] |
| Supported package families | — | DIP, SO, TO, PLCC[3] |
| Device pitch | — | Down to 0.65 mm[3] |
| Device length | — | 5 mm to 60 mm[3] |
| Device width | — | Up to 40 mm[3] |
| Applications | — | Automotive power devices, consumer electronics, logic and analog[3] |
| Contact type | — | Standard to high power Kelvin[3] |
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