Comparison ledger
KLA 1007, Multitest MT 9510, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | MT 9510Multitest |
|---|---|---|
| OEM | KLA | Multitest |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | 2001 |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Multitest MT 9510 |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Configuration | — | VC1/10S3E BGA[3] |
| Max temp | — | 175*C[7] |
| System | — | STD[8] |
| Temperature Range | — | -40/ 155[8] |
| Installed Kit | — | TQFP 7x7[8] |
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