Comparison ledger
KLA 1007, LTX-Credence PAX, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | PAXLTX-Credence |
|---|---|---|
| OEM | KLA | LTX-Credence |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | LTX-Credence PAX |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | tester[3] |
| SSBA | — | 1[3] |
| OVI | — | 1[3] |
| HCOVI | — | 1[3] |
| AWG_HSB | — | 1[3] |
| DIG_HB | — | 1[3] |
| DDP_PIN | — | 1[3] |
| DDP_SEQ | — | 1[3] |
| XRF | — | 1[3] |
| Modules listed | — | SSBA, OVI, HCOVI, AWG_HSB, DIG_HB, DDP_PIN, DDP_SEQ, XRF[3] |
| SSBA count | — | 1[3] |
| OVI count | — | 1[3] |
| HCOVI count | — | 1[3] |
| AWG_HSB count | — | 1[3] |
| DIG_HB count | — | 1[3] |
| DDP_PIN count | — | 1[3] |
| DDP_SEQ count | — | 1[3] |
| XRF count | — | 1[3] |
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