Comparison ledger
Applied Materials 0720 06060 Part, Keysight 4142 B, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | 4142 BKeysight |
|---|---|---|
| OEM | Applied Materials | Keysight |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Keysight 4142 B |
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[1] | — |
| Architecture | — | Mainframe with 8 slots for plug-in measurement units[2] |
| Integrated measurement functions | — | Current/voltage sources, nanovoltmeters, and picoammeters in one instrument[2] |
| Source Monitor Unit (SMU) sensitivity | — | Forces voltage while measuring currents down to 20 fA; forces current while monitoring voltages down to 40 µV[2] |
| HP 41420A High Power SMU | — | 2 slots; 40 µV to 200 V, 20 fA to 1 A (±200 V and ±1 A)[2] |
| HP 41421B Medium Power SMU | — | 1 slot; 40 µV to 100 V, 20 fA to 100 mA (±100 V and ±100 mA)[2] |
| HP 41422A High Current Unit (HCU) | — | 2 slots; pulse mode only; 100 µs pulsed measurements up to ±10 V and 10 A[2] |
| HP 41423A High Voltage Unit (HVU) | — | 2 slots; DC or pulsed measurements to ±1000 V; low-leakage design measures currents down to 2 pA[2] |
| HP 41425A Analog Feedback Unit (AFU) | — | 1 slot; used with two SMUs for analog voltage/current searches; finds target values in 12 ms[2] |
| Maximum configuration coverage | — | 2000 V max using two HVUs; 20 A (pulsed) using two HCUs[2] |
| Maximum output power | — | Sum of all measurement units' instantaneous output power cannot exceed 32 W[2] |
| Maximum common-to-ground voltage | — | ±42 V[2] |
| Ground Unit (GNDU) | — | High-current SMU set to 0 V, used as measurement ground; Kelvin connection; maximum offset voltage ±500 µV; current range ±1.6 A[2] |
| Program memory | — | Approx. 2000 program steps, groupable into 99 subroutines[2] |
| Data memory | — | Maximum 4095 data values (binary) or 1023 data values (ASCII)[2] |
| Measurement modes | — | Plug-in units operate individually or in synchronized modes to perform ten different types of measurements[2] |
| Interfaces | — | HP-IB; external trigger input (TTL, negative logic, minimum pulse width 100 µs); external trigger output (TTL, negative logic)[2] |
| Self-test and calibration | — | Self-test at power-up; offset errors in each measurement unit auto-calibrated every 30 minutes[2] |
| Operating temperature | — | 5 °C to 40 °C[2] |
| Operating humidity | — | 5% to 80% RH[2] |
| Storage temperature and humidity | — | -40 °C to 65 °C; <90% RH at 65 °C[2] |
| Power requirements | — | 100/120/220 V ±10%; 240 V -10%/+5%; maximum 750 VA (48-66 Hz)[2] |
| Dimensions | — | 426 mm W × 235 mm H × 676 mm D[2] |
| Weight | — | Mainframe approx. 23 kg; plug-in units 2-3 kg each[2] |
| Typical measurement time (SMU) | — | HP 41420A/HP 41421B SMU (20 V/100 mA range, spot measurement): force I or V in 3.5 ms; measure I or V in 4.0 ms[2] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →