Waferpedia

Comparison ledger

-407B-1-S-CES293 Robotversus3640 Wafer Disk Analyzer

ABM -407B-1-S-CES293 Robot, Rigaku 3640 Wafer Disk Analyzer, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
OEMABMRigaku
Category——
Wafer size——
Process node——
Introduced——
Production run—1977–
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyABM -407B-1-S-CES293 RobotRigaku 3640 Wafer Disk Analyzer
Specifications
ModelABM-407B-1-S-CES293[1]3640 Wafer / Disk Analyzer[2]
DescriptionROBOT[1]—
Refurbished RTP RTAAG Associates 4100, 4108, 8108, 8800, 8800i,210, 310, 410, 610, 610I, MPT RTP-600S, 800S, RTP-3000[1]—
KLA-Tencor Spare Parts and ServiceRS-35C,RS-55,RS-75,RS-100,UV-1050,UV-1080,UV-1250,UV-1280,ASET F5 / F5X,AIT Systems,HRP-220 Stylus Profiler[1]—
Refurbished Isotropic Plasma EtcherMatrix, Tegal, Lam Research, Branson/IPC, PlasmaTherm[1]—
Refurbished PECVD, ALD EquipmentCambridge, Oxford PlasmaLab , Plasma-Therm, STS/SPTS, AMAT[1]—
Refurbished Mask AlignerCanon Neutronix PLA501/545, Suss MA200CC, MA8BA8 GEN3, MA8BA8 GEN2, MA8BA8, MA200E[1]—
Refurbished BondingSUSS SB6E, SUSS SB8E, EVG 620 BA, EVG EV501, West Bond 7200AR 7400A[1]—
Refurbished Wafer ProberElectroglas EG 4090u+, EG 4090, EG 2001X, EG 1034X, Cascade PS-21[1]—
Make—Rigaku[2]
Wafer size—8 inch[2]
Sample size—8" max.[3]
Sample stage—XYθ driving system, spin mechanism (for center measurement)[3]
Elements for simultaneous analysis—16 elements max.[3]
Goniometer—Fixed type goniometer for each element; scanning type goniometer for Ti through U[3]
Collimator—2 kinds for automatic exchange; selectable from 5, 10, 15 and 20 mm dia.[3]
Automatic vacuum degree controller—13 Pa ± 1 Pa (APC: automatic pressure controller)[3]
Temperature stabilizer—Available[3]
X-ray tube—Rh target, 3 kW[3]
X-ray generator—Maximum output: 3 kVA[3]
Heat exchanger—Distilled water recirculation system (with ion exchange resin)[3]
Vacuum pump—Dry pump (QDP-80)[3]
Cassette-to-cassette—Optional[3]
Orientation flat/notch—Adjustable[3]
Software—Multiwindow/multitask FP method for multilayer thin film wafer measuring direction setting program[3]
Mapping—Optional[3]
Personal computer—DOS/V compatible[3]
Operating system—OS/2 Warp[3]
Display/peripherals—15" color CRT, ink jet printer[3]
Sources (3)Every fact above is drawn from these public sources
  1. [1]dealer listingsemistarcorp.com
  2. [2]Equipment inventory listing
  3. [3]ptwsingapore.comptwsingapore.com