Waferpedia

Comparison ledger

1200versus1220

View Engineering 1200, View Engineering 1220, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
1200View Engineering
1220View Engineering
OEMView EngineeringView Engineering
Categorymachine vision-based CMMmachine vision-based CMM
Wafer size——
Process node——
Introduced19821985
Production run—1985–
Lifecycle—Legacy
Lifecycle milestones1982 Introduced1985 introduced · 1985 introduction
Control system——
Generation—2nd generation
FamilyView Engineering 1200View Engineering 1220
Specifications
Typebinary image, machine vision-based CMM[1]Machine vision-based coordinate measuring machine[1]
Introduction year1982[1]—
Product typeBinary image, machine vision-based CMM[1]—
Imaging technologyBinary image[1]—
Product timeline year1982[1]—
manufacturer—VIEW Engineering[1]
model—1220[1]
generation—2nd generation[1]
image type—grayscale image[1]
system type—machine vision-based CMM[1]
year introduced—1985[1]
Imaging—Grayscale[1]

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Sources (1)Every fact above is drawn from these public sources
  1. [1]en.wikipedia.orgen.wikipedia.org