Comparison ledger
LTX-Credence PAX, Tektronix 11401 Oscilloscope, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | PAXLTX-Credence | 11401 OscilloscopeTektronix |
|---|---|---|
| OEM | LTX-Credence | Tektronix |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | LTX-Credence PAX | — |
| Specifications | ||
| SSBA | 1[1] | — |
| OVI | 1[1] | — |
| HCOVI | 1[1] | — |
| AWG_HSB | 1[1] | — |
| DIG_HB | 1[1] | — |
| DDP_PIN | 1[1] | — |
| DDP_SEQ | 1[1] | — |
| XRF | 1[1] | — |
| Equipment type | tester[1] | — |
| Modules listed | SSBA, OVI, HCOVI, AWG_HSB, DIG_HB, DDP_PIN, DDP_SEQ, XRF[1] | — |
| SSBA count | 1[1] | — |
| OVI count | 1[1] | — |
| HCOVI count | 1[1] | — |
| AWG_HSB count | 1[1] | — |
| DIG_HB count | 1[1] | — |
| DDP_PIN count | 1[1] | — |
| DDP_SEQ count | 1[1] | — |
| XRF count | 1[1] | — |
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