Comparison ledger
KLA 1007, Zeiss Contura G 2 CMM, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | Contura G 2 CMMZeiss |
|---|---|---|
| OEM | KLA | Zeiss |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Zeiss Contura G 2 CMM |
| Specifications | ||
| Manufacturer | KLA[1] | Zeiss[3] |
| Model | 1007[1] | Contura G 2[3] |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | Coordinate Measuring Machine (CMM)[3] |
| Configuration | — | 7.7.6 RDS[3] |
| Software | — | Calypso 2019[3] |
| Measuring Range | — | 700 x 700 x 600 mm[4] |
| Category | — | Dimensional Calibrators[5] |
| Probe head | — | RDS Probe Head[3] |
| Scanning probe | — | Vast XXT Scanning Probe[3] |
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