Comparison ledger
KLA 1007, Tektronix TM 5006 Test Measurement, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | TM 5006 Test MeasurementTektronix |
|---|---|---|
| OEM | KLA | Tektronix |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Tektronix TM 5006 Test Measurement |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | TM 5006[3] |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | Tektronix[3] |
| Equipment type | Prober[2] | — |
| Configuration | — | Option 12[3] |
| Category | — | Test & Probe[4] |
| Option | — | Option 12[3] |
| With | — | SI 5010 Programmable Scanner[3] |
| Power & electrical | — | PS 5010 Programmable Power Supply[4] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →