Comparison ledger
KLA 1007, SUSS MicroTec PA 200, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | PA 200SUSS MicroTec |
|---|---|---|
| OEM | KLA | SUSS MicroTec |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | SUSS MicroTec PA 200 |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | 1997[3] |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Configuration | — | 400 VA[3] |
| Voltage | — | 110 V[3] |
| Frequency | — | 60 Hz[3] |
| Power consumption | — | 400 VA[3] |
| Dimensions (H x W x D) | — | 54 in x 32 in x 32 in[4] |
| Weight | — | 163.29 kg[4] |
| Operation type | — | Semi-automatic[4] |
| Country of origin | — | United States[4] |
| Dimensions | — | 54 x 32 x 32 inches[4] |
| Type | — | Prober[3] |
| Operation | — | SemiAutomatic[4] |
| Use | — | Precise semiconductor wafer testing and electrical measurement[4] |
| Power | — | 400 VA[5] |
| Electrical | — | 110 V, 60 Hz[5] |
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