Comparison ledger
KLA 1007, Multitest MT 2168 XT, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | MT 2168 XTMultitest |
|---|---|---|
| OEM | KLA | Multitest |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Multitest MT 2168 |
| Cited variants | — |
|
| Specifications | ||
| Manufacturer | KLA[2] | — |
| Model | 1007[2] | — |
| Description | Wafer Prober[2] | — |
| Wafer size | 150 mm[2] | — |
| Convertible to 8 inch wafer size | Yes[2] | — |
| Vintage | 01.06.1995[2] | — |
| Make | KLA[3] | — |
| Equipment type | Prober[3] | — |
| OS Version | — | QNX[4] |
| Configuration | — | Some parts taken out[5] |
| Operating System | — | QNX[4] |
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