Comparison ledger
KLA 1007, LTX-Credence X-Series MX, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | X-Series MXLTX-Credence |
|---|---|---|
| OEM | KLA | LTX-Credence |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | LTX-Credence X-Series |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Tester OS | — | Unison 4.2.0[3] |
| Tester PC | — | PC-X1[3] |
| Configuration | — | slot1: STEPBUSⅡ_ADAP_NEW[3] |
| slot2 | — | OCTAL_VI[3] |
| slot3 | — | HCOVI[3] |
| slot4 | — | DCTM[3] |
| slot6 | — | HVVI[3] |
| slot8 | — | QFVI_VI[3] |
| slot9 | — | QTMP[3] |
| slot10 | — | SWGHSB[3] |
| slot12 | — | DIGHSB[3] |
| slot14 | — | HEX_VI[3] |
| slot15 | — | TH_PECFX2[3] |
| slot16 | — | TH_PECFX2[3] |
| slot17 | — | TH_THBDFX_DIR_TMP_REFCLK[3] |
| slot18 | — | TH_PECFX2[3] |
| slot19 | — | TH_PECFX2[3] |
| slot20 | — | HEX_VIB[3] |
| slot33 | — | STEPBUSⅡ_ADAP_NEW[3] |
| slot34 | — | OCTAL_VI[3] |
| slot1 | — | STEPBUSⅡ_ADAP_NEW[3] |
| slot49 | — | TH_THBDFX_DIR_TMP_REFCLK[3] |
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