Comparison ledger
Eagle ETS 200 T, Teradyne J 750, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ETS 200 TEagle | J 750Teradyne |
|---|---|---|
| OEM | Eagle | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | Windows XP SP3 |
| Generation | — | — |
| Family | Eagle ETS 200 T | Teradyne J 750 |
| Cited variants |
| — |
| Specifications | ||
| Configuration | with Electroglas EG 4090 Prober[1] | 512 Pins[3] |
| Vintage | 2006[1] | — |
| Product type | Tester[1] | — |
| Model | ETS 200 T[1] | J 750[3] |
| Make | Eagle[1] | Teradyne[3] |
| Discrete test platform | Built on proven ETS technology[2] | — |
| Testing mode | True index-parallel testing[2] | — |
| Handler compatibility | Turret and rotary handlers[2] | — |
| Applications | Wafer sort to final test for MOSFETs[2] | — |
| Integrated measurements | UIL, dVSD, Qg and LCR meter[2] | — |
| Board | — | Channel[3] |
| PN | — | 239-001-04 1 ed 182 0945-D 5445[3] |
| Computer OS Version | — | Windows XP SP3[4] |
| IG-XL Version | — | 3.50.40[4] |
| Phase | — | 3 Phase[5] |
| Voltage | — | 208 VAC, 30 A, 50/60 Hz[8] |
| Borad | — | CUB[3] |
| Pin count | — | 512 pins[3] |
| Electrical input | — | 3 Phase - 3 Wire + PE - 50/60 Hz - 30 A, 208 Vac[5] |
| Application context | — | wafer-form integrated circuit testing[9] |
| Probe-station docking | — | A-type configuration[9] |
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