Waferpedia

Comparison ledger

0720 06060 Partversus4PP-TypeF

Applied Materials 0720 06060 Part, KLA 4PP-TypeF, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
0720 06060 PartApplied Materials
OEMApplied MaterialsKLA
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0720 06060 PartKLA 4PP-TypeF
Specifications
ConfigurationContact Pin 24-20 Awg Crimp Gold Flash[1]—
Model—4PP-TypeF[2]
Probe spacing—0.625mm[3]
Tip radius—40um[3]
Force—100gm[3]
Material—230-0918[4]
Application—Metal measurement[3]
Compatible systems—Filmetrics R50 / R54[4]
Probe type—4PP probe[3]
Spacing—0.625 mm[3]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]store.kla-instruments.comstore.kla-instruments.com
  3. [3]cntech.co.ukcntech.co.uk
  4. [4]store.kla-instruments.comstore.kla-instruments.com