Waferpedia

Comparison ledger

0720 06060 Partversus1150 01016 Part

Applied Materials 0720 06060 Part, Applied Materials 1150 01016 Part, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
0720 06060 PartApplied Materials
1150 01016 PartApplied Materials
OEMApplied MaterialsApplied Materials
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0720 06060 PartApplied Materials 1150 01016 Part
Specifications
ConfigurationContact Pin 24-20 Awg Crimp Gold Flash[1]Probe Test Pin Contact Lands&Pads Nkl / Sl[2]

Plan your fab

Building a Test & Probe process? Get a complete equipment list.

Open the fab equipment planner →
Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing