Waferpedia

Comparison ledger

0010-03254 E Chuckversus600

Applied Materials 0010-03254 E Chuck, Meyer Burger 600, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
0010-03254 E ChuckApplied Materials
600Meyer Burger
OEMApplied MaterialsMeyer Burger
Category——
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
Family—Meyer Burger 600
Specifications
test benches—over 40 state-of-the-art test benches[1]
test types—electrical, mechanical and optical measurements[1]
internal standard—IEC standard 61215-2[1]
laboratory space—over 500 m²[1]
temperature range—-40 °C to 85 °C[1]
humidity—up to 85 %[1]
temperature change cycles—up to 600 times per test run[1]
endurance test duration—up to 3,000 hours[1]
Sources (1)Every fact above is drawn from these public sources
  1. [1]web.archive.orgweb.archive.org