Comparison ledger
Advantest T 5593, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5593Advantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5593 | KLA 1007 |
| Specifications | ||
| Configuration | 1 Test Head[1] | — |
| Ampere Rating of Largest Motor | 17 A[2] | — |
| Device Types | DDR2 SDRAM, High-speed SRAM[3] | — |
| Maximum Devices per System | 256 (128 x 2 stations for x8/x9 bit)[3] | — |
| Test Speed | 533 MHz / 1.066 GHz (DDR mode)[3] | — |
| Test Heads | 1[1] | — |
| Parallel Measurement Bits (Configuration) | 128 Para MB (KH7-010063/064) or 64 Para MB (KH7-010037/038)[1] | — |
| Power Supply Frequency | 50/60 Hz[2] | — |
| Calibration Board Vintage | 2007[2] | — |
| Manufacturer | — | KLA[4] |
| Model | — | 1007[4] |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
| Equipment type | — | Prober[5] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →