Comparison ledger
ABM -407B-1-S-CES293 Robot, Chroma 3380 P, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 3380 PChroma | |
|---|---|---|
| OEM | ABM | Chroma |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | ABM -407B-1-S-CES293 Robot | Chroma 3380 P |
| Specifications | ||
| Model | ABM-407B-1-S-CES293[1] | — |
| Description | ROBOT[1] | — |
| Refurbished RTP RTA | AG Associates 4100, 4108, 8108, 8800, 8800i,210, 310, 410, 610, 610I, MPT RTP-600S, 800S, RTP-3000[1] | — |
| KLA-Tencor Spare Parts and Service | RS-35C,RS-55,RS-75,RS-100,UV-1050,UV-1080,UV-1250,UV-1280,ASET F5 / F5X,AIT Systems,HRP-220 Stylus Profiler[1] | — |
| Refurbished Isotropic Plasma Etcher | Matrix, Tegal, Lam Research, Branson/IPC, PlasmaTherm[1] | — |
| Refurbished PECVD, ALD Equipment | Cambridge, Oxford PlasmaLab , Plasma-Therm, STS/SPTS, AMAT[1] | — |
| Refurbished Mask Aligner | Canon Neutronix PLA501/545, Suss MA200CC, MA8BA8 GEN3, MA8BA8 GEN2, MA8BA8, MA200E[1] | — |
| Refurbished Bonding | SUSS SB6E, SUSS SB8E, EVG 620 BA, EVG EV501, West Bond 7200AR 7400A[1] | — |
| Refurbished Wafer Prober | Electroglas EG 4090u+, EG 4090, EG 2001X, EG 1034X, Cascade PS-21[1] | — |
| Clock rate | — | 50/100 MHz[2] |
| Data rate | — | 50/100 Mbps[2] |
| I/O pins | — | 1024 I/O pins (max. 1280 I/O pins)[2] |
| Parallel testing | — | Up to 1024 sites parallel testing[2] |
| Pattern memory | — | 32/64/128 pattern memory[2] |
| Capture memory per pin | — | 16M capture memory per pin[2] |
| VI source | — | Various VI source[2] |
| Hardware architecture | — | Flexible hardware architecture with interchangeable I/O, VI, and ADDA[2] |
| Trim/match function | — | Real parallel trim/match function[2] |
| Measurement unit | — | Time and frequency measurement unit (TFMU)[2] |
| STDF tools support | — | Supported[2] |
| Test program/pattern converter | — | Supported; J750, D10, S50/100, E320, SC312, V7, TRI-6036, etc.[2] |
| AD/DA test | — | Option[2] |
| SCAN test | — | Option; max. 2G M/chain[2] |
| ALPG test | — | Option for embedded memory[2] |
| Programming language | — | CRAFT C/C++[2] |
| Operating environment | — | User-friendly Windows 7 environment[2] |
| Design | — | All-in-one design for test head only[2] |
| Product type | — | VLSI test system[2] |
| STDF support | — | STDF tools support[2] |